CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies > Editions

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)

Published June 21st 2008 by Springer

2008, Hardcover, 212 pages

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing Book 40)

Published June 1st 2008 by Springer

2008, Kindle Edition, 212 pages

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[(CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies : Process-aware SRAM Design and Test)] [By (author) Andrei Pavlov ] published on (October, 2010)

Published January 1st 2010 by Springer

Paperback, 0 pages

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) by Andrei Pavlov (2008-06-23)

Published January 1st 1673 by Springer

Hardcover, 0 pages

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Paperback)

Published July 17th 2008 by Springer

Paperback, 212 pages

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)

Published October 28th 2010 by Springer

Softcover reprint of hardcover 1st ed. 2008, Paperback, 210 pages

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