Manoj Sachdev

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Manoj Sachdev

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Manoj Sachdev’s books

Average rating: 2.5 · 2 ratings · 0 reviews · 7 distinct works

	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing Book 34) by Manoj Sachdev, José Pineda de Gyvez 2.50 avg rating — 2 ratings — published 2007 — 6 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40) by Andrei Pavlov, Manoj Sachdev it was ok 2.00 avg rating — 2 ratings — published 2008 — 7 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Defect Oriented Testing for CMOS Analog and Digital Circuits 0.00 avg rating — 0 ratings — published 1997 — 4 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) 2nd edition by Sachdev, Manoj, Pineda de Gyvez, Jose (2007) Hardcover by Manoj Sachdev, Unknown Author 0.00 avg rating — 0 ratings	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Thermal and Power Management of Integrated Circuits by Arman Vassighi, Manoj Sachdev 0.00 avg rating — 0 ratings — published 2006 — 7 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	ESD Protection Device and Circuit Design for Advanced CMOS Technologies by Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev 0.00 avg rating — 0 ratings — published 2008 — 5 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing Book 40) by Andrei Pavlov, Manoj Sachdev 0.00 avg rating — 0 ratings	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars

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