Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits > Editions
by Manoj Sachdev First published June 4th 2007
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing Book 34)
Published June 4th 2007
by Springer
2, Kindle Edition, 349 pages
Published November 10th 2010
by Springer
Softcover reprint of hardcover 2nd ed. 2007, Paperback, 349 pages
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing Book 34)
Published June 4th 2007
by Springer
2, Kindle Edition
Published January 1st 2010
by New Age International Publisher
Paperback, 0 pages
Published August 25th 2008
by Springer
Paperback, 352 pages
Published June 21st 2007
by Springer
2nd, 2nd ed. 2007, Hardcover, 349 pages