Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits > Editions

by Manoj Sachdev First published June 4th 2007

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing Book 34)
Published June 4th 2007 by Springer
2, Kindle Edition, 349 pages
ISBN:
9780387465470 (ISBN10: 0387465472)
ASIN:
B0044KMB40
Edition language:
English
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Published November 10th 2010 by Springer
Softcover reprint of hardcover 2nd ed. 2007, Paperback, 349 pages
ISBN:
9781441942852 (ISBN10: 1441942858)
ASIN:
1441942858
Edition language:
English
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing Book 34)
Published June 4th 2007 by Springer
2, Kindle Edition
ASIN:
B0CXYVZTGL
Edition language:
English
Average rating:
0.0 (0 ratings)
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Published January 1st 2010 by New Age International Publisher
Paperback, 0 pages
Author(s):
ISBN:
9788184894295 (ISBN10: 8184894295)
ASIN:
8184894295
Edition language:
English
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Published August 25th 2008 by Springer
Paperback, 352 pages
ISBN:
9780387516530 (ISBN10: 0387516530)
ASIN:
0387516530
Edition language:
English
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Published June 21st 2007 by Springer
2nd, 2nd ed. 2007, Hardcover, 349 pages
ISBN:
9780387465463 (ISBN10: 0387465464)
ASIN:
0387465464
Edition language:
English
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