Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits > Editions
by Manoj Sachdev First published June 4th 2007
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing Book 34)
Published June 4th 2007
by Springer
2, Kindle Edition, 349 pages
Author(s):
ISBN:
9780387465470
(ISBN10: 0387465472)
ASIN:
B0044KMB40
Edition language:
English
Average rating:
2.50
(2 ratings)
Published November 10th 2010
by Springer
Softcover reprint of hardcover 2nd ed. 2007, Paperback, 349 pages
Author(s):
ISBN:
9781441942852
(ISBN10: 1441942858)
ASIN:
1441942858
Edition language:
English
Average rating:
0.0
(0 ratings)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing Book 34)
Published June 4th 2007
by Springer
2, Kindle Edition
Author(s):
ASIN:
B0CXYVZTGL
Edition language:
English
Average rating:
0.0
(0 ratings)
Published January 1st 2010
by New Age International Publisher
Paperback, 0 pages
Author(s):
ISBN:
9788184894295
(ISBN10: 8184894295)
ASIN:
8184894295
Edition language:
English
Average rating:
0.0
(0 ratings)
Published August 25th 2008
by Springer
Paperback, 352 pages
Author(s):
ISBN:
9780387516530
(ISBN10: 0387516530)
ASIN:
0387516530
Edition language:
English
Average rating:
0.0
(0 ratings)
Published June 21st 2007
by Springer
2nd, 2nd ed. 2007, Hardcover, 349 pages
Author(s):
ISBN:
9780387465463
(ISBN10: 0387465464)
ASIN:
0387465464
Edition language:
English
Average rating:
0.0
(0 ratings)
