[(CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies : Process-aware SRAM Design and Test)] [By (author) Andrei Pavlov ] published on

by Andrei Pavlov

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. provide process-aware solutions for SRAM design and test challenges.

Paperback

First published January 1, 2008