VLSI Design and Test > Editions

by Anirban Sengupta

Sort by

Format

Language

Editions

Showing 1-2 of 2

VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers (Communications in Computer and Information Science Book 1066)

Published August 17th 2019 by Springer

1st ed. 2019, Kindle Edition, 1,331 pages

Author(s):

Anirban Sengupta (Goodreads Author) (editor),

Sudeb Dasgupta (Editor),

Virendra Singh (Editor),

Rohit Sharma (Goodreads Author) (Editor)

ISBN:

9789813297678 (ISBN10: 9813297670)

ASIN:

B07WQKPF5L

Edition language:

English

Average rating:

0.0 (0 ratings)

more details

Rate this book

Clear rating

1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars

VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (Paperback)

Published October 12th 2019 by Springer

1st ed. 2019, Paperback, 768 pages

Author(s):

Anirban Sengupta (Goodreads Author) (Editor),

Sudeb Dasgupta (Editor),

Virendra Singh (Editor),

Rohit Sharma (Goodreads Author) (Editor)

ISBN:

9789813297661 (ISBN10: 9813297662)

ASIN:

9813297662

Edition language:

English

Average rating:

0.0 (0 ratings)

more details

Rate this book

Clear rating

1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars