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by Anirban Sengupta

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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers (Communications in Computer and Information Science Book 1066)

Published August 17th 2019 by Springer

1st ed. 2019, Kindle Edition, 1,331 pages

Author(s):

Anirban Sengupta (Goodreads Author) (editor),

Sudeb Dasgupta (Editor),

Virendra Singh (Editor),

Rohit Sharma (Goodreads Author) (Editor)

ISBN:

9789813297678 (ISBN10: 9813297670)

ASIN:

B07WQKPF5L

Edition language:

English

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VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (Paperback)

Published October 12th 2019 by Springer

1st ed. 2019, Paperback, 768 pages

Author(s):

Anirban Sengupta (Goodreads Author) (Editor),

Sudeb Dasgupta (Editor),

Virendra Singh (Editor),

Rohit Sharma (Goodreads Author) (Editor)

ISBN:

9789813297661 (ISBN10: 9813297662)

ASIN:

9813297662

Edition language:

English

Average rating:

0.0 (0 ratings)

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