R. Beanland
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Electron Microscopy and Analysis
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published
2000
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2 editions
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Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK
by
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published
2000
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2 editions
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Electron Microscopy and Analysis
by
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published
1992
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2 editions
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