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IEC 60747-16-4 Ed. 1.0 en:2004, Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
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IEC 60749-14 Ed. 1.0 b:2003, Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations
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IEC 60749-13 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
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IEC 60749-11 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
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IEC 60749-10 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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IEC 60748-3 Ed. 1.0 b:1986, Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
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IEC 60748-2-20 Ed. 1.0 b:2000, Semiconductor devices - Integrated circuits Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
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IEC 60748-23-3 Ed. 1.0 en:2002, Semiconductor devices - Integrated circuits: Part 23-3: Hybrid integrated circuits and film structures - ... self-audit checklist and report
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IEC 60748-1 Ed. 2.0 b:2002, Semiconductor devices - Integrated circuits - Part 1: General
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IEC 60748-11 Ed. 1.0 b:1990, Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
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IEC 60748-11-1 Ed. 1.0 b:1992, Semiconductor devices - Integrated circuits - Part 11 - Section 1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
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IEC 60747-8-1 Ed. 1.0 b:1987, Semiconductor devices - Discrete devices: Part 8: Field-effect transistors - Section One: Blank detail specification ... field-effect transistors up to 5 W and 1 GHz
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IEC 60747-6-3 Ed. 1.0 b:1993, Semiconductor devices - Discrete devices: Part 6: Thyristors - Section Three: Blank detail specification for reverse ... case-rated, for currents greater than 100 A
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IEC 60747-5-4 Ed. 1.0 b:2006, Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
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IEC 60747-3 Ed. 1.0 b:1985, Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes
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IEC 60730-2-9 Ed. 2.2 b:2004, Automatic electrical controls for household and similar use - Part 2-9: Particular requirements for temperature sensing controls
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IEC 60747-16-2 Ed. 1.0 en:2001, Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
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IEC 60747-15 Ed. 1.0 en:2003, Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
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IEC 60747-14-2 Ed. 1.0 en:2000, Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
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IEC 60747-14-1 Ed. 1.0 en:2000, Semiconductor devices - Part 14-1: Semiconductor sensors - General and classification
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IEC 60747-11 Ed. 1.0 b:1985, Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
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IEC 60747-10 Ed. 2.0 b:1991, Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
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IEC 60746-5 Ed. 1.0 b:1992, Expression of performance of electrochemical analyzers - Part 5: Oxidation-reduction potential or redox potential
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IEC 60746-4 Ed. 1.0 b:1992, Expression of performance of electrochemical analyzers - Part 4: Dissolved oxygen in water measured by membrane covered amperometric sensors
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IEC 60746-2 Ed. 2.0 en:2003, Expression of performance of electrochemical analyzers - Part 2: pH value
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IEC 60746-1 Ed. 2.0 en:2003, Expression of performance of electrochemical analyzers - Part 1: General
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IEC 60741 Ed. 1.0 b:1982, Multichannel amplitude analyzers: Standards for time-to-amplitude converters
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IEC 60739 Ed. 1.0 b:1983, Digital counting ratemeters - Characteristics and test methods
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IEC/TR 60736 Ed. 1.0 b:1982, Testing equipment for electrical energy meters
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IEC 60732 Ed. 1.0 b:1982, Measuring methods for cylinder cores, tube cores and screw cores of magnetic oxides
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