2007 IEEE International Conference on Microelectronic Test Structures > Editions

collapse details

by Institute of Electrical and Electronics Engineers First published January 1st 2007

Sort by

Format

Language

Editions

Showing 1-2 of 2

2007 IEEE International Conference on Microelectronic Test Structures: Icmts: (Unknown Binding)

Published January 1st 2007 by IEEE Computer Society Press

Unknown Binding, 275 pages

Author(s):

Institute of Electrical and Electronics Engineers (Contributor)

ISBN:

9781424407811 (ISBN10: 1424407818)

ASIN:

1424407818

Edition language:

English

Average rating:

5.00 (1 rating)

less detail

Rate this book

Clear rating

1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars

2007 IEEE International Conference on Microelectronic Test Structures (Paperback)

Published January 1st 2007 by IEEE

Paperback, 249 pages

Author(s):

Institute of Electrical and Electronics Engineers (Compiler)

ISBN:

9781424407804 (ISBN10: 142440780X)

ASIN:

142440780X

Edition language:

English

Average rating:

0.0 (0 ratings)

less detail

Rate this book

Clear rating

1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars