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A Sensitive Technique Using Atomic Force Microscopy to Measure the Low Earth Orbit Atomic Oxygen Erosion of Polymers > Editions

by National Aeronautics and Space Administration

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A Sensitive Technique Using Atomic Force Microscopy to Measure the Low Earth Orbit Atomic Oxygen Erosion of Polymers
A Sensitive Technique Using Atomic Force Microscopy to Measure the Low Earth Orbit Atomic Oxygen Erosion of Polymers (Paperback)
Published August 27th 2018 by Createspace Independent Publishing Platform
Paperback, 30 pages
Author(s):
ISBN:
9781726160131 (ISBN10: 1726160130)
ASIN:
1726160130
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A Sensitive Technique Using Atomic Force Microscopy to Measure the Low Earth Orbit Atomic Oxygen Erosion of Polymers
A Sensitive Technique Using Atomic Force Microscopy to Measure the Low Earth Orbit Atomic Oxygen Erosion of Polymers (Paperback)
Published May 29th 2018 by Createspace Independent Publishing Platform
Paperback, 30 pages
Author(s):
ISBN:
9781720364764 (ISBN10: 1720364761)
ASIN:
1720364761
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0.0 (0 ratings)
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