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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits > Editions

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by Sandeep K Goel

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
Published December 19th 2017 by CRC Press
1, Kindle Edition, 241 pages
Author(s):
ISBN:
9781351825016 (ISBN10: 1351825011)
ASIN:
B078JPLBPS
Edition language:
English
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
Published March 29th 2017 by CRC Press
1, Paperback, 264 pages
Author(s):
ISBN:
9781138075771 (ISBN10: 1138075779)
ASIN:
1138075779
Edition language:
English
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Kindle Edition)
Published December 19th 2017 by CRC Press
Kindle Edition, 259 pages
Author(s):
ISBN:
9781351833707 (ISBN10: 1351833707)
ASIN:
1351833707
Edition language:
English
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