Testing of Interposer-Based 2.5D Integrated Circuits > Editions

by Ran Wang

Testing of Interposer-Based 2.5D Integrated Circuits
Published March 20th 2017 by Springer
Kindle Edition, 318 pages
ASIN:
B0DF48SZXX
Edition language:
English
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Testing of Interposer-Based 2.5D Integrated Circuits
Published March 20th 2017 by Springer
1st ed. 2017, Kindle Edition, 318 pages
ISBN:
9783319547145 (ISBN10: 3319547143)
ASIN:
B06XRKTSB4
Edition language:
English
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Testing of Interposer-Based 2.5D Integrated Circuits
Published March 23rd 2017 by Springer
Paperback, 198 pages
Author(s):
ISBN:
9783319547152 (ISBN10: 3319547151)
ASIN:
3319547151
Edition language:
English
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Testing of Interposer-Based 2.5D Integrated Circuits
Published May 9th 2018 by Springer
Softcover reprint of the original 1st ed. 2017, Paperback, 196 pages
ISBN:
9783319854618 (ISBN10: 3319854615)
ASIN:
3319854615
Edition language:
English
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Testing of Interposer-Based 2.5D Integrated Circuits
Published March 29th 2017 by Springer
1st ed. 2017, Hardcover, 196 pages
ISBN:
9783319547138 (ISBN10: 3319547135)
ASIN:
3319547135
Edition language:
English
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