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Designing, Testing, and Diagnostics--Join Them > Editions

by Institute of Electrical and Electronics Engineers First published January 1st 1993

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Designing, Testing, and Diagnostics--Join Them: International Test Conference 1993 Proceedings: October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Designing, Testing, and Diagnostics--Join Them: International Test Conference 1993 Proceedings: October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (Unknown Binding)
Published January 1st 1993 by Conference
Unknown Binding, 1,065 pages
Author(s):
ISBN:
9780780314313 (ISBN10: 078031431X)
ASIN:
078031431X
Edition language:
English
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Designing, testing, and diagnostics--join them: International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Designing, testing, and diagnostics--join them: International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (Unknown Binding)
Published January 1st 1993 by Can be ordered from IEEE Service Center
Unknown Binding, 1,065 pages
Author(s):
ISBN:
9780780314290 (ISBN10: 0780314298)
ASIN:
0780314298
Edition language:
English
Average rating:
0.0 (0 ratings)
more details
Rate this book
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