Memory Tecnology, Design, and Testing; Proceedings > Editions

by Institute of Electrical and Electronics Engineers First published September 1st 1999

Memory Tecnology, Design, and Testing; Proceedings: International Workshop on Memory Techology, Design and Testing (2009: Hsinchu, Taiwan)
Published January 1st 2009 by IEEE Computer Society Press
Illustrated, Paperback, 95 pages
ISBN:
9780769537979 (ISBN10: 0769537979)
ASIN:
0769537979
Edition language:
English
Average rating:
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Memory Technology, Design and Testing (Mtdt '99), 1999 IEEE International Workshop on: IEEE Computer Society, Sponsor(S
Published January 1st 1999 by IEEE
1999 ed., Paperback, 131 pages
ISBN:
9780769502595 (ISBN10: 0769502598)
ASIN:
0769502598
Edition language:
English
Average rating:
0.0 (0 ratings)
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