Power-Constrained Testing of VLSI Circuits > Editions

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicolici, Nicola, Al-Hashimi, Bashir M. (2003) Hardcover

Published January 1st 1656 by Springer; 2003 edition (2003-02-28)

Hardcover

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Paperback)

Published June 5th 2013 by Springer

Paperback, 192 pages

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Power-Constrained Testing of VLSI Circuits (Kindle Edition)

Published December 10th 2004 by Plenum Publishing Corporation

Kindle Edition, 191 pages

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing Book 22)

Published April 11th 2006 by Springer

2003, Kindle Edition, 178 pages

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

Published December 9th 2010 by Springer

Softcover reprint of the original 1st ed. 2003, Paperback, 189 pages

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)

Published February 28th 2003 by Springer

2003, Hardcover, 189 pages

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