Nanosystems Design and Technology > Editions

[Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)] [Author: x] [November, 2013]

Published by CRC Press

Hardcover, 0 pages

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

Published October 25th 2013 by CRC Press

1, Hardcover, 259 pages

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

Published December 19th 2017 by CRC Press

Kindle Edition, 259 pages

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Nanosystems Design and Technology (Unknown Binding)

Published October 25th 2013 by CRC Press

Unknown Binding, 259 pages

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