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Wai Kin Chim

Average rating: 5.0 · 1 rating · 1 review · 2 distinct works

	Proceedings Of The 1999 7th International Symposium On The Physical & Failure Analysis Of Integrated Circuits [Ipfa '99: 5 9 July, 1999, Orchard Hotel, Singapore] it was amazing 5.00 avg rating — 1 rating	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy 0.00 avg rating — 0 ratings — published 2000	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars

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