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IEC 60779 Ed. 2.0 b:2005, Industrial electroheat equipment - Test methods for electroslag remelting furnaces
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IEC 60793-1-51 Ed. 1.0 b:2001, Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat
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IEC 60793-1-48 Ed. 1.0 b:2003, Optical fibres - Part 1-48: Measurement methods and test procedures - Polarization mode dispersion
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IEC 60793-1-45 Ed. 1.0 b:2001, Optical fibres - Part 1-45: Measurement methods and test procedures - Mode field diameter
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IEC 60793-1-44 Ed. 1.0 b:2001, Optical fibres - Part 1-44: Measurement methods and test procedures - Cut-off wavelength
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IEC 60793-1-43 Ed. 1.0 b:2001, Optical fibres - Part 1-43: Measurement methods and test procedures - Numerical aperture
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IEC 60793-1-42 Ed. 1.0 b:2001, Optical fibres - Part 1-42: Measurement methods and test procedures - Chromatic dispersion
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IEC 60793-1-40 Ed. 1.0 b:2001, Optical fibres - Part 1-40: Measurement methods and test procedures - Attenuation
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IEC 60793-1-34 Ed. 2.0 b:2006, Optical fibres - Part 1-34: Measurement methods and test procedures - Fibre curl
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IEC 60793-1-33 Ed. 1.0 b:2001, Optical fibres - Part 1-33: Measurement methods and test procedures - Stress corrosion susceptibility
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IEC 60793-1-32 Ed. 1.0 b:2001, Optical fibres - Part 1-32: Measurement methods and test procedures - Coating strippability
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IEC 60793-1-31 Ed. 1.0 b:2001, Optical fibres - Part 1-31: Measurement methods and test procedures - Tensile strength
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IEC 60793-1-22 Ed. 1.0 b:2001, Optical fibres - Part 1-22: Measurement methods and test procedures - Length measurement
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IEC 60793-1-21 Ed. 1.0 b:2001, Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
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IEC 60793-1-20 Ed. 1.0 b:2001, Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
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IEC 60749-15 Ed. 1.0 b:2003, Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
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IEC 60774-2 Ed. 1.0 b:1999, Helical-scan video tape cassette system using 12,65 mm (0,5 in) magnetic tape on type VHS - Part 2: FM audio recording
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IEC 60763-2 Ed. 1.0 b:1991, Specification for laminated pressboard - Part 2: Methods of test
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IEC 60761-5 Ed. 2.0 b:2002, Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
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IEC 60761-4 Ed. 2.0 b:2002, Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 4: Specific requirements for radioactive iodine monitors
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IEC 60761-3 Ed. 2.0 b:2002, Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 3: Specific requirements for radioactive noble gas monitors
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IEC 60761-2 Ed. 2.0 b:2002, Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols
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IEC 60761-1 Ed. 2.0 b:2002, Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
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IEC 60758 Ed. 3.0 en:2004, Synthetic quartz crystal - Specifications and guide to the use
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IEC 60749-5 Ed. 1.0 b:2003, Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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IEC 60749-36 Ed. 1.0 b:2003, Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
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IEC 60749-23 Ed. 1.0 b:2004, Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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IEC 60749-19 Ed. 1.0 b:2003, Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
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IEC 60749-18 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation
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IEC 60749-16 Ed. 1.0 b:2003, Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection
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