Scanning Electron Microscopy and X-Ray Microanalysis

by Joseph I. Goldstein

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Genres: Physics

708 pages, Hardcover

First published November 30, 1981

Reviews

[Loukie Adlem · Rating 5 out of 5]

Only the best book to have on hand in the SEM lab.

[Petr Polovodov · Rating 5 out of 5]

Good reference for SEM scientists and engineers.

[Marissa · Rating 1 out of 5]

honestly the most difficult exam i have done and WOULD NOT RECOMMEND unless it is necessary for your degree 😘