Secondary Ion Mass Spectrometry: Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (Sims Six), Palais Des Congre Ve

by H.W. Werner (Editor), A. Huber (Editor)

The SIMS conference is recognized worldwide as a distinguished forum for those involved in the study and use of SIMS techniques, bringing together scientists working in fundamental research and instrument development, researchers using the SIMS method of analysis, service companies and instrument manufacturers.

1078 pages, Hardcover

First published May 25, 1988