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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

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Overview.- On IEEE P1500's Standard for Embedded Core Test.- Test Planning, Access and Scheduling.- An Integrated Framework for the Design and Optimization of SOC Test Solutions.- On Concurrent Test of Core-Based SOC Design.- A Novel Reconfigurable Wrapper for Testing of Embedded Core-Based SOCs and its Associated Scheduling Algorithm.- The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs.- A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing.- An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch.- Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores.- Test Data Compression.- Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor.- Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test.- Interconnect, Crosstalk and Signal Integrity.- Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores.- Signal Fault Modeling and Testing in High-Speed SoCs.- On-Chip Clock Faults' Detector.

212 pages, Paperback

First published September 30, 2002

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