Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

by D. Kennedy Williams (Editor), R Shimizu (Editor)

Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.

284 pages, Hardcover

First published January 1, 2000