Atom Probe Field Ion Microscopy

by M.K. Miller, A. Cerezo, the late M. G. Hetherington

The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic-scale science and technology. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject. It includes recent advances in the method which have allowed for new and exciting applications to emerge in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

520 pages, Hardcover

First published November 28, 1996

About the author

Michael Kenneth Miller

His Atom probe microanalysis, 1989: CIP t.p. (M.K. Miller; Metals and Ceramics Div., Oak Ridge Natl. Lab., Oak Ridge, TN)