Secondary Ion Mass Spectrometry SIMS VIII

by H.W. Werner (Editor), K.T.F. Janssen, J. Tumpner

The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.

944 pages, Hardcover

First published July 1, 1992