An Introduction to Surface Analysis by XPS and AES

by John F. Watts, John Wolstenholme

Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.

224 pages, Hardcover

First published May 7, 2003