Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

by Yang Leng

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

384 pages, Hardcover

First published January 1, 2008

Reviews

[Mohamed]

This is an absolutely great book to understand the main analytical methods, with simple explanations that even for a complete beginner, one can still understand pretty much everything, this book helped me a lot and i'd like to send a special thank you to professor Yang Leng.

[K]

This edition has a lot of typos (for example pg. 61, table 2.2), but it was still a comprehensive book for materials characterization.