Microscopy of Semiconducting Materials 1985, Proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 25-27 ... 1985

by A.G. Cullis

Provides an overview of developments in transmission and scanning electron microscopy to the study of the structure and electrical properties of semiconducting materials. Spans the range of elemental and compound semiconductors. Of interest to researchers in condensed matter, materials science and device physics.

544 pages, Hardcover

First published January 1, 1985