Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing: Isle of Bendor, France, 10-12 July 2002

by Yervant Zorian (Editor)

Drawn for the July 2002 conference on the Isle of Bendor, these 24 papers discuss memory BISYT analysis and applications, memory and soft errors, reliability in railway and automotive systems, embedded memory yield enhancement, embedded memory systems and test optimization, memory test strategies, fault modeling, embedded memory compilation, EPROM/EEPROM design, and process technology. Only authors appear in the index. Annotation c. Book News, Inc., Portland, OR (booknews.com)

150 pages, Paperback

First published September 1, 2002