Digital Systems Testing and Testable Design

by Miron Abramovici

Modeling, logic simulation, fault modeling, fault simulation, testing for single stuck faults, testing for bridging faults, functioning testing, design for test ability, compression techniques, built-in self test, logic-level diagnosis, self-checking design, PLA testing, system-level diagnosis.

653 pages, Hardcover

First published January 1, 1990