Microscopy of Semiconducting Materials 1989, Proceedings of the Royal Microscopical Society Conference held at Oxford University, 10-13 April 1989

by A.G. Cullis

Microscopy of Semiconducting Materials 1989 brings together both the invited and contributed papers from this conference. The main subject areas covered include: high resolution microscopy, microanalysis, epitaxial layers, quantum wells and superlattices, bulk GaAs, X-ray studies, dielectric structures, silicides and metal-semiconductor contacts, device studies and advanced scanning microscopy techniques. This volume provides an indispensable guide for researchers in physics, materials science, electronics and electrical engineering.

820 pages, Hardcover

First published January 1, 1989