The IEEE International Workshop on Defect And Fault Tolerance in Vlsi Systems

by Quebec) International Workshop on Defect and Fault Tolerance in VLSI Systems (1994 : Montreal, IEEE Computer Society (Contributor)

Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright Book News, Inc. Portland, Or.

299 pages, Hardcover

Published January 1, 1994