Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

by Alvin Warren Czanderna (Editor), Theodore E. Madey, Cedric J. Powell (Editor)

This introductory text describes the principles, techniques, and methods vital for efficient surface analysis.

451 pages, Kindle Edition

First published October 1, 1998

About the author

American Surface scientist. Recipient Industrial Research International Rectifier -100 award, 1977.