Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations

by Rajesh Garg, Sunil P Khatri

This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems.

236 pages, Paperback

First published October 23, 2009