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by Brajesh Kumar Kaushik

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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711)

Published December 22nd 2017 by Springer

1st ed. 2017, Paperback, 836 pages

Author(s):

Brajesh Kumar Kaushik (Editor),

Sudeb Dasgupta (Editor),

Virendra Singh (Editor)

ISBN:

9789811074691 (ISBN10: 9811074690)

ASIN:

9811074690

Edition language:

English

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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science Book 711)

Published December 21st 2017 by Springer

1st ed. 2017, Kindle Edition, 1,432 pages

Author(s):

Brajesh Kumar Kaushik (editor),

Sudeb Dasgupta (Editor),

Virendra Singh (Editor)

ISBN:

9789811074707 (ISBN10: 9811074704)

ASIN:

B078JQTYXY

Edition language:

English

Average rating:

0.0 (0 ratings)

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