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Scanning Microscopy for Nanotechnology: Techniques and Applications
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Scanning Microscopy for Nanotechnology: Techniques and Applications

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Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. T

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Published 2006 by Springer
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Jordi
marked it as to-read
Apr 03, 2012
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