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Transmission Electron Microscopy and Diffractometry of Materials
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Transmission Electron Microscopy and Diffractometry of Materials

5.0 of 5 stars 5.00  ·  rating details  ·  3 ratings  ·  0 reviews
This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been ...more
Hardcover, 778 pages
Published December 1st 2007 by Springer (first published January 1st 2001)
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